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Cross-Layer Reliability of Computing Systems - (Materials, Circuits and Devices) (Hardcover) - 1 of 1

Cross-Layer Reliability of Computing Systems - (Materials, Circuits and Devices) (Hardcover)

$160.00

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About this item

Highlights

  • Reliability has always been a major concern in designing computing systems.
  • Author(s): Giorgio Di Natale & Dimitris Gizopoulos & Stefano Di Carlo & Alberto Bosio & Ramon Canal
  • 328 Pages
  • Technology, Electronics
  • Series Name: Materials, Circuits and Devices

Description



About the Book



This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.



Book Synopsis



Reliability has always been a major concern in designing computing systems. However, the increasing complexity of such systems has led to a situation where efforts for assuring reliability have become extremely costly, both for the design of solutions for the mitigation of possible faults, and for the reliability assessment of such techniques.

Cross-layer reliability is fast becoming the preferred solution. In a cross-layer resilient system, physical and circuit level techniques can mitigate low-level faults. Hardware redundancy can be used to manage errors at the hardware architecture layer. Eventually, software implemented error detection and correction mechanisms can manage those errors that escaped the lower layers of the stack.

This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. The book begins by addressing design techniques to improve the resilience of computing systems, covering the logic layer, the architectural layer and the software layer. The second part of the book focuses on cross-layer resilience, including coverage of physical stress, reliability assessment approaches, fault injection at the ISA level, analytical modelling for cross-later resiliency, and stochastic methods.

Cross-Layer Reliability of Computing Systems is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.

Dimensions (Overall): 9.4 Inches (H) x 6.3 Inches (W) x .8 Inches (D)
Weight: 1.55 Pounds
Suggested Age: 22 Years and Up
Number of Pages: 328
Genre: Technology
Sub-Genre: Electronics
Series Title: Materials, Circuits and Devices
Publisher: Institution of Engineering & Technology
Theme: General
Format: Hardcover
Author: Giorgio Di Natale & Dimitris Gizopoulos & Stefano Di Carlo & Alberto Bosio & Ramon Canal
Language: English
Street Date: October 22, 2020
TCIN: 1011118438
UPC: 9781785617973
Item Number (DPCI): 247-40-9476
Origin: Made in the USA or Imported
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Shipping details

Estimated ship dimensions: 0.8 inches length x 6.3 inches width x 9.4 inches height
Estimated ship weight: 1.55 pounds
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Q: Who is the intended audience for this book?

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  • A: The book is aimed at researchers, postgraduate students, and professional computer architects.

    submitted byAI Shopping Assistant - 21 days ago
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Q: What type of publication format is available for this book?

submitted by AI Shopping Assistant - 21 days ago
  • A: The book is available in hardcover format.

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Q: What is the genre of this book?

submitted by AI Shopping Assistant - 21 days ago
  • A: The genre is technology, specifically focusing on electronics.

    submitted byAI Shopping Assistant - 21 days ago
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Q: Who are the authors of this book?

submitted by AI Shopping Assistant - 21 days ago
  • A: The authors include Giorgio Di Natale, Dimitris Gizopoulos, Stefano Di Carlo, Alberto Bosio, and Ramon Canal.

    submitted byAI Shopping Assistant - 21 days ago
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Q: What are some key topics covered in this book?

submitted by AI Shopping Assistant - 21 days ago
  • A: The book covers design techniques, cross-layer resilience, reliability assessment approaches, and error detection mechanisms.

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