Sponsored
ULSI Devices - by C y Chang & Simon M Sze Hardcover
$253.95
In Stock
Eligible for registries and wish lists
Sponsored
About this item
Highlights
- Ultrahoch integrierte Schaltkreise (ULSI) - die nächste Schaltkreisgeneration - werden zwar noch nicht industriell eingesetzt, sind aber das Objekt intensiver Forschungsarbeit.
- About the Author: C. Y. CHANG, PhD, is a National Chair Professor at the National Chiao Tung University in Hsinchu, Taiwan.
- 744 Pages
- Technology, Electronics
Description
Book Synopsis
Ultrahoch integrierte Schaltkreise (ULSI) - die nächste Schaltkreisgeneration - werden zwar noch nicht industriell eingesetzt, sind aber das Objekt intensiver Forschungsarbeit. Sie versprechen Vorteile im Stromverbrauch, arbeiten bei niedrigerer Spannung und sind schneller. Die Herausgeber dieses Buches haben die bekanntesten Forscher auf dem Gebiet der Schaltkreise gewonnen, um jeweils ein Kapitel zu ihrem eigenen Spezialgebiet zu schreiben. Kompetent und hochaktuell! (01/00)
From the Back Cover
A complete guide to current knowledge and future trends in ULSI devices Ultra-Large-Scale Integration (ULSI), the next generation of semiconductor devices, has become a hot topic of investigation. ULSI Devices provides electrical and electronic engineers, applied physicists, and anyone involved in IC design and process development with a much-needed overview of key technology trends in this area. Edited by two of the foremost authorities on semiconductor device physics, with contributions by some of the best-known researchers in the field, this comprehensive reference examines such major ULSI devices as MOSFET, nonvolatile semiconductor memory (NVSM), and the bipolar transistor, and the improvements these devices offer in power consumption, low-voltage and high-speed operation, and system-on-chip for ULSI applications. Supplemented with introductory material and references for each chapter as well as more than 400 illustrations, coverage includes:
* The physics and operational characteristics of the different components
* The evolution of device structures the ultimate limitations on device and circuit performance
* Device miniaturization and simulation
* Issues of reliability and the hot carrier effect
* Digital and analog circuit building blocks
Review Quotes
"the production standard and component chapters is characteristically high" (Contemporary Physics, Vol.42, No. 4 2001)
About the Author
C. Y. CHANG, PhD, is a National Chair Professor at the National Chiao Tung University in Hsinchu, Taiwan.
S. M. SZE, PhD, is UMC Chair Professor at the National Chiao Tung University.
Dimensions (Overall): 9.59 Inches (H) x 6.46 Inches (W) x 1.63 Inches (D)
Weight: 2.62 Pounds
Suggested Age: 22 Years and Up
Number of Pages: 744
Genre: Technology
Sub-Genre: Electronics
Publisher: Wiley-Interscience
Theme: Integrated, Circuits
Format: Hardcover
Author: C y Chang & Simon M Sze
Language: English
Street Date: May 18, 2000
TCIN: 1008775653
UPC: 9780471240679
Item Number (DPCI): 247-05-7714
Origin: Made in the USA or Imported
If the item details aren’t accurate or complete, we want to know about it.
Shipping details
Estimated ship dimensions: 1.63 inches length x 6.46 inches width x 9.59 inches height
Estimated ship weight: 2.62 pounds
We regret that this item cannot be shipped to PO Boxes.
This item cannot be shipped to the following locations: American Samoa (see also separate entry under AS), Guam (see also separate entry under GU), Northern Mariana Islands, Puerto Rico (see also separate entry under PR), United States Minor Outlying Islands, Virgin Islands, U.S., APO/FPO
Return details
This item can be returned to any Target store or Target.com.
This item must be returned within 90 days of the date it was purchased in store, shipped, delivered by a Shipt shopper, or made ready for pickup.
See the return policy for complete information.