Metrology for 5g and Emerging Wireless Technologies - Telecommunications by Tian Hong Loh Hardcover

About the Book

This edited book is the first to focus on metrology for current and future wireless communication technologies. It presents a comprehensive overview of the state-of-the-art measurement capabilities, testbeds and relevant R&D activities for 5G and emerging wireless technologies at a wide range of frequencies up to THz frequency bands.

Book Synopsis

Metrology has a pivotal role to ensure the vision of fifth generation (5G) and emerging wireless technologies to be realised. It is essential to develop the underpinning metrology in response to the high demand for universal, dynamic, and data-rich wireless applications. As new technologies for 5G and beyond increasingly emerge in the arena of modern wireless devices/systems, the standards bodies, industries, and research communities are facing the challenge of diverse technological requirements, and on verifying products that meet desired performance parameters.

This edited book is the first to focus on metrology for current and future wireless communication technologies. It presents a comprehensive overview of the state-of-the-art measurement capabilities, testbeds and relevant R&D activities for 5G and emerging wireless technologies at a wide range of frequencies up to THz frequency bands. Several real-world field trials and use cases are also presented. The book focuses on R&D of measurement techniques and metrology for 5G and beyond that underpin all aspects, from signals, devices, antennas, systems and propagation environments to RF exposure. The presented materials describe advances in the triad of measurement system design, measurement techniques, and underpinning metrology required to cover many wireless communications aspects.

This book, Metrology for 5G and Emerging Wireless Technologies provides timely support to industry, academia, standard bodies and NMIs during the development of 5G and emerging wireless technologies and will support readers to enable further metrological R&D activities.